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Categories
» Scientific Instruments
» Nanotechnology tools
| Thin film and nano coating analysing instruments |
| Country: |
United States of America |
| Link to your website: |
http://www.nanometrics.com |
Description:
Nanometrics offers metrology systems that precisely measure a wide range of film types deposited on substrates during manufacturing in order to control manufacturing processes and increase production yields. The non-contact, non-destructive metrology systems use a broad spectrum of wavelengths, high sensitivity optics, proprietary software and patented technologies to measure the thickness, CD, optical constants and uniformity of films and structures deposited on silicon and other substrates. In addition, the company has microscope and software-based technology for measuring the relative alignment of adjacent thin film layers - a critical parameter in device production. |
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